T. Itoh et al., PIEZOELECTRIC MICROCANTILEVER ARRAY FOR MULTIPROBE SCANNING FORCE MICROSCOPY, IEICE transactions on electronics, E80C(2), 1997, pp. 269-273
We have developed and operated a newly conceived multiprobe scanning F
orce microscope (SFM) using microfabricated piezoelectric cantilevers.
An array of piezoelectric microcantilevers with a piezoelectric ZnO l
ayer on an SiO2 film makes it possible to build a multiprobe SFM syste
m. Multiprobe SFMs are required for the application of SFM to the prob
e lithography and high density data storage. Each cantilever probe of
multiprobe system should have a detector for sensing of its own deflec
tion and an actuator for positioning of its tip. The piezoelectric can
tilever can detect its own vibration amplitude by measuring the piezoe
lectric current, and it can also drive its tip by applying a voltage t
o the piezoelectric layer. Therefore, the piezoelectric cantilever is
suitable for each cantilever of the array in the multiprobe SFM. We ha
ve verified the applicability of the piezoelectric cantilever to each
lever of the array by characterizing the sensitivities of the deflecti
on sensing and actuation. The ZnO piezoelectric cantilever with tile l
ength of 125 mu m works as the z scanner with the sensitivity of 20 nm
/V. We have also fabricated an experimental piezoelectric microcantile
ver array with ten cantilevers. We have constructed parallel operation
SFM system with two cantilevers of the Fabricated array and successfu
lly obtained parallel images of 1 mu m pitch grating in constant heigh
t mode.