ELECTRON SPECTROSCOPIC INVESTIGATION OF POLYMERS AND GLASSES

X-ray induced photo and Auger electron spectroscopic techniques have b een applied to investigate conducting polymers, their blends and some glasses. In the Nls region of the spectra of films containing polypyrr ole the peak corresponding to N+ at 402.0 eV is separated from the neu tral N. Intensity of the N+ peak can be correlated with electrical con ductivity of the films and the spectroscopically derived ratio of F/N is close to 4 indicating that one BF4- dopant ion is incorporated for every oxidized nitrogen center. In the spectra of the films of polyth iophene and its blends peaks corresponding to S and S+ can not be reso lved, but again F/C ratio correlates with the electrical conductivity. On the basis of measured XPS chemical shifts in the binding energies the chemical state of Sn (+2 or +4) incorporated on to the float glass es could not be assigned. Use of the Auger parameter lets one separate relaxation and chemical contributions. The derived true chemical shif ts of Sn on neat-glasses are larger than those of SnO and/or SnO2 due to the larger ionic environment of the glass matrix.