Phase shifting methods are widely used in photomechanics to analyse fr
inge patterns obtained from interferometry, moire, etc. The phase is d
etermined by modulo 2pi and an unwrapping process is needed. An algori
thm is presented which avoids most of the inconsistency of the phase f
ield. It can be applied to the relief determination of virtually any o
bject shape. In this paper, two applications are performed using the p
rojection of a parallel line grating with a pitch equal to 4mm. The ac
curacy is shown to be around 0.1 mm.