M. Missous et S. Ohagan, NONSTOICHIOMETRY AND DOPANTS RELATED PHENOMENA IN LOW-TEMPERATURE GAAS GROWN BY MOLECULAR-BEAM EPITAXY, Journal of applied physics, 75(7), 1994, pp. 3396-3401
The growth of GaAs at low temperatures (LT GaAs) at or below 250-degre
es-C, under standard molecular beam epitaxy growth conditions usually
results in a massive incorporation of excess As in the lattice which t
hen totally dominates the electrical and optical characteristics of th
e as grown material resulting in almost electrically and optically ina
ctive material (or at least defects controlled). We report on new phen
omena associated with the growth of GaAs at 250-degrees-C and we show
data on highly electrically active doped material. The electro-optical
properties of this material are literally undistinguishable from mate
rial grown at 580-degrees-C. By careful control of the growth conditio
ns, material in which total defect concentrations of less than 10(17)
cm-3, well below the huge 10(20) cm-3 that is normally obtained in LT
GaAs, can be achieved therefore demonstrating that high quality GaAs c
an in effect be grown at extremely low temperatures. The implications
for such material are far reaching and these will be discussed in the
light of these new results.