LOW-FREQUENCY RESISTANCE FLUCTUATION MEASUREMENTS ON CONDUCTING POLYMER THIN-FILM RESISTORS

Low-frequency resistance fluctuations were measured on-polypyrrole thi n-film resistors. The samples were obtained by chemical-vapor depositi on onto copper chloride patterned precursors. The measurements were de voted to characterize the noise spectral density of constant-current-b iased samples. The dependence of the noise magnitude on the applied de voltage was studied revealing that the noise cannot be ascribed only to equilibrium resistance fluctuations. Application of the Hooge formu la provided an estimate of carrier density in the material.