HIGH-SENSITIVITY 2-DIMENSIONAL THERMAL-STRESS-INDUCED AND MECHANICAL-STRESS-INDUCED BIREFRINGENCE MEASUREMENTS IN A ND-YAG ROD

Authors
OHMI M AKATSUKA M ISHIKAWA K NAITO K YONEZAWA Y NISHIDA Y YAMANAKA M IZAWA Y NAKAI S
Citation
M. Ohmi et al., HIGH-SENSITIVITY 2-DIMENSIONAL THERMAL-STRESS-INDUCED AND MECHANICAL-STRESS-INDUCED BIREFRINGENCE MEASUREMENTS IN A ND-YAG ROD, Applied optics, 33(27), 1994, pp. 6368-6372
Citations number
8
Categorie Soggetti
Optics
Journal title
Applied optics → ACNP
ISSN journal
00036935
Volume
33
Issue
27
Year of publication
1994
Pages
6368 - 6372
Database
ISI
SICI code
0003-6935(1994)33:27<6368:H2TAM>2.0.ZU;2-D
Abstract
A novel polarimeter for measuring the two-dimensional (2D) thermal- an d mechanical-stress-induced birefringence in solid-state laser materia ls such as Nd:YAG is proposed. Using this device, we could sensitively measure the direction of the principal birefringence axis as well as the phase shift delta with sign when delta < pi/4. The 2D thermal- and mechanical-stress-induced birefringence in a laser-diode-pumped Nd:YA G rod was successfully measured with the proposed polarimeter. We also found an active quarter-wave Nd:YAG phase retarder.