Of 17 metals that were investigated, it was found that there exists no
linear relationship between Schottky barrier height and metal work fu
nction as is suggested by the Schottky-Mott theory. These metals were
deposited in an ultra-high vacuum system on chemically etched (100) OM
VPE-grown GaAs with a free carrier density of 10(16) cm(-3). It was, h
owever, possible to distinguish between three ''groups'' of metals on
the basis of Schottky barrier height. The first group consists only of
Y and Mg (mean barrier height of 0.67 +/- 0.07 eV) and the second of
Al, Hf, Mn, V, Ti, Cr, Fe, Co and Ni (0.81 +/- 0.04 eV). The third gro
up consists of Cu and the precious metals Ag, Au, Pd and Pt, which hav
e a mean barrier height of 0.97 +/- 0.04 eV. This fact suggests that t
he Fermi level is pinned at energy levels in the band gap, of which th
e position (0.75, 0.61 and 0.45 eV above the valence band, respectivel
y) depends on which of these three ''groups'' a metal belongs to. The
first, second and third groups covered electronegativity ranges from 1
.22 to 1.31, 1.30 to 1.91 and 1.90 to 2.54, respectively. Stepwise inc
reases in the Schottky barrier height occurred at electronegativities
of 1.30 (barrier height increased stepwise from 0.67 eV to 0.81 eV) an
d at 1.90 (from 0.81 eV to 0.97 eV). This relationship between Schottk
y barrier heights and Pauling's electronegativities of the contact met
als suggests that interfacial chemistry plays a crucial role during Sc
hottky barrier formation.