N. Uchida et al., AN EXCIMER-LASER STEPPER WITH THROUGH-THE-LENS ALIGNMENT, International journal of the Japan Society for Precision Engineering, 28(2), 1994, pp. 150-155
A new excimer laser stepper at 248 nm wavelength has been developed. T
he numerical aperture and field size of the all quartz 5x reduction le
ns are 0.4 and 15mm square, respectively. A key feature of the system
is a through-the-lens alignment system using an optical heterodyne met
hod operating with a 633 nm He-Ne laser. The problem of the large foca
l plane difference between the exposure and alignment wavelength has b
een solved by the new alignment system using two separated grating mar
ks on the reticle and a checkerboard grating on the wafer. Moreover, a
wafer leveling mechanism and a yaw compensation mechanism have been d
eveloped in order to realize precise positioning of the wafer stage. E
xposure experiments have proved that the resolution is 0.35 mum and th
e overlay accuracy is better than 0.1 mum.