MICROSTRUCTURAL DEVELOPMENT IN PHYSICAL VAPOR-DEPOSITED PARTIALLY-STABILIZED ZIRCONIA THERMAL BARRIER COATINGS

The effects of processing parameters of physical vapour deposition on the microstructure of partially stabilized zirconia (PSZ) thermal barr ier coatings have been experimentally investigated. Emphasis has been placed on the crystallographic texture of the PSZ coatings and the mic rostructure of the top surface of the PSZ coatings as well as the meta l-ceramic interface. The variations in the deposition chamber temperat ure, substrate thickness, substrate rotation and vapour incidence angl e resulted in the observation of significant differences in the crysta llographic texture and microstructure of the PSZ coatings.