GROWTH AND STRUCTURE OF POLYCRYSTALLINE CR AU MULTILAYERED THIN-FILMS/

Metallic multilayered thin films have recently been investigated due t o their new magnetic and transport properties. The interest here is fo cussed on the characterization of the interfaces between the layers. T he analysis of growth and structure of polycrystalline Cr/Au multilaye rs is accomplished by two complementary techniques: in situ ultrahigh vacuum scanning tunnelling microscopy and ex situ transmission electro n microscopy. The combination of these powerful methods provides detai led information about structural characteristics such as crystallite s ize, surface roughness and crystallographic orientation. Moreover, con clusions can be drawn on the atomic arrangement and growth mechanism a t the Cr-Au interface. The results are supported by semiempirical and theoretical expectations.