B. Flietner et I. Eisele, WORK FUNCTION MEASUREMENTS FOR GAS-DETECTION USING TIN OXIDE LAYERS WITH A THICKNESS BETWEEN 1-NM AND 200-NM, Thin solid films, 250(1-2), 1994, pp. 258-262
Tin oxide films, 1, 2, 20, 50, 80 and 200 nm thick, were deposited on
platinum and titanium/tungsten surfaces by reactive sputter deposition
. The structure and composition of tin oxide as well as the film homog
eneity were investigated by scanning electron microscopy, Anger electr
on spectroscopy, Rutherford backscattering spectrometry and atomic for
ce microscopy. The 200 nm SnO2 films are polycrystalline, with a grain
size between 40 and 80 nm. For layers between 20 and 200 nm the compo
sition is characteristic for stoichiometric SnO2. The 1 and 2 nm layer
s show a homogeneous coverage of the metal. For all sensitive systems
gas measurements were carried out with a Kelvin probe. Testing gases w
ere humidity (40% r.h.), carbon monoxide (1000 ppm), hydrogen (100 ppm
), nitrogen dioxide (8 ppm) and ammonia (10 ppm). For thinner SnO2 adl
ayers only surface-related processes contribute to the response, which
is still material specific. It turns out that the thin layers are mor
e stable.