An atomic structure model for a 25 degrees [001] symmetric tilt grain
boundary in SrTiO3 has been determined directly from experimental data
with the use of high-resolution Z-contrast imaging coupled with elect
ron energy loss spectroscopy. The derived model of the grain boundary
was refined by bond-valence sum calculations and reveals candidate sit
es for dopant atoms in the boundary plane. These results show how the
combined techniques can be used to deduce the atomic structure of defe
cts and interfaces without recourse to preconceived structural models
or image simulations.