We prepared Ni80Fe20 films by the sputter-beam method and investigated
their magnetotransport properties. The very thin film of 200 Angstrom
exhibited a high magnetoresistance of 3.5% after an appropriate post-
annealing treatment. The improvement is due to the decrease of zero-fi
eld resistivity resulting from remarkable grain growth in the films. T
aking into account diffusive electron scattering at the film surface,
the magnetoresistance value is thought to be very close to that of the
bulk.