THIN-FILMS OF ICOSAHEDRAL AL-MN PHASES - ASSESSMENT OF STRUCTURAL PERFECTION

Authors
MANAILA R POPESCU R KORONY G JIANU A DEVENYI A BARNA PB CSANADY A DEVENYI AM
Citation
R. Manaila et al., THIN-FILMS OF ICOSAHEDRAL AL-MN PHASES - ASSESSMENT OF STRUCTURAL PERFECTION, Thin solid films, 251(1), 1994, pp. 14-18
Citations number
15
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
251
Issue
1
Year of publication
1994
Pages
14 - 18
Database
ISI
SICI code
0040-6090(1994)251:1<14:TOIAP->2.0.ZU;2-R
Abstract
The icosahedral metastable Al-Mn phase was obtained in thin films prep ared by the high temperature sequential vapor deposition method. Analy sis of X-ray diffraction line profiles allows an estimate of the rando m phason strain, revealing the presence of a highly disordered icosahe dral fraction. Its concentration is correlated with the degree of crys tallographic perfection of the Al substrate. Thereby, the crucial role of Al diffusion in the formation of the icosahedral phase is evidence d.