Kl. Lin et Cj. Chen, THE INTERACTIONS BETWEEN IN-SN SOLDERS AND AN ELECTROLESS NI-P DEPOSIT UPON HEAT-TREATMENT, Journal of materials science. Materials in electronics, 7(6), 1996, pp. 397-401
The interactions between In-Sn solders and an electroless Ni-P deposit
with in the multilayer combinations comprised of In-Sn/electroless Ni
-P/Al were investigated with the aid of heat treatments at various tem
peratures and durations. The main reaction product was identified with
X-ray diffractometry (XRD) as In3Ni2 regardless of the In-contents of
the In-Sn solders. The formation of this In3Ni2 compound occurred thr
ough the diffusion of Ni towards the In-Sn solder. The intermetallic c
ompound layer achieved its maximum thickness within 100 h upon heat tr
eatment at 60 degrees C; the thickness of the compound layer did not i
ncrease upon extending heat treatment. Sn tended to dissolve in the In
3Ni2 compound.