CHARACTERIZATION OF THE PERTURBATION EFFECT OF A PROBE HEAD USING THEFD-TD METHOD

The perturbation effect of a probe head in microwave measurement is in vestigated by using the FD-TD method. A two-simulation approach with i mproved accuracy is employed to predict the insertion loss caused by t he probe head. Depending on the diameter and reclining angle of the pr obe head, a maximum insertion insertion loss of up to 0.8 dB has been calculated for an example structure. This work provides a rigorous and quantitative estimation of the probe effect. The analysis results may also serve as a guidance for optimal designing and positioning of pro be heads so that a minimum field perturbation during measurement can b e expected.