Nv. Agrinskaya et Tv. Mashovets, SELF-COMPENSATION IN SEMICONDUCTORS - A REVIEW DEDICATED TO THE 100THANNIVERSARY OF THE BIRTHDAY OF FRENKEL,YAKOV,ILICH, Semiconductors, 28(9), 1994, pp. 843-857
The current state of the problem of self-compensation in semiconductor
s is reviewed. This effect consists of a limitation on the density of
electrons (or holes) in a semiconductor in comparison with the concent
ration of the primary dopant, i.e., shallow donors (or acceptors). In
this case the doping itself stimulates processes which prevent a shift
of the Fermi level toward the conduction or valence band. Various mod
els of self-compensation are discussed. They involve the formation of
intrinsic compensating defects, the formation of defect-impurity compl
exes, and a relaxation of the lattice near an impurity atom accompanie
d by the formation of a bistable impurity state. Experimental manifest
ations of self-compensation in covalent crystals, III-V and II-VI comp
ounds, and also amorphous semiconductors indicate that different self-
compensation mechanisms probably operate in different materials. The e
ffectiveness of these mechanisms is governed by such parameters as the
width of the band gap, the covalent or ionic radius of the impurity,
and the binding energy of the atoms in the lattice. (C) 1994 American
Institute of Physics.