We report measurements of strained InGaAs/GaAs quantum well laser diod
es with electron cyclotron resonance (ECR) plasma etched mirrors that
are passivated and smoothed with a novel technique involving the selec
tive area growth of GaAs by vacuum atomic layer epitaxy. The threshold
current of as-cleaved, etched, and passivated devices has been studie
d and a significant improvement in mirror feedback is shown with the p
assivation and smoothing of etched mirrors oriented along the [001] pl
anes. (C) 1994 American Institute of Physics.