CURRENT-VOLTAGE CHARACTERISTICS OF ELECTRIC CONTACTS ON P-TYPE ZNSE

Citation
Z. Yang et Jf. Schetzina, CURRENT-VOLTAGE CHARACTERISTICS OF ELECTRIC CONTACTS ON P-TYPE ZNSE, Journal of electronic materials, 23(10), 1994, pp. 1071-1074
Citations number
13
Categorie Soggetti
Engineering, Eletrical & Electronic","Material Science
ISSN journal
03615235
Volume
23
Issue
10
Year of publication
1994
Pages
1071 - 1074
Database
ISI
SICI code
0361-5235(1994)23:10<1071:CCOECO>2.0.ZU;2-S
Abstract
The current-voltage characteristics of electric contacts made of diffe rent materials on p-type ZnSe that form Schottky barriers from 0.3 to 1.2 eV are studied theoretically using the formula J=AT/k integral-in finity/0T(E)[F(E) - F(E - eV)]dE, where T(E) is the energy-dependent q uantum tunneling probability and F(E) is the Fermi distribution functi on. The contribution to the total current of both the thermionic emiss ion and the tunneling are therefore included. The net doping concentra tions under study range from 1.0 x 10(17) cm-3 to 1.0 x 10(19) cm-3. T he reverse bias voltage across the barrier at a current density of 200 A/cm2 is used to assess whether the barrier is reduced to an ohmic co ntact. A barrier of 0.3 eV is already an ohmic contact at doping conce ntration p = 1.0 x 10(17) cm-3, while a barrier of 1.2 eV still behave s like a diode even at p = 1.0 x 10(19) cm-3.