Z. Yang et Jf. Schetzina, CURRENT-VOLTAGE CHARACTERISTICS OF ELECTRIC CONTACTS ON P-TYPE ZNSE, Journal of electronic materials, 23(10), 1994, pp. 1071-1074
The current-voltage characteristics of electric contacts made of diffe
rent materials on p-type ZnSe that form Schottky barriers from 0.3 to
1.2 eV are studied theoretically using the formula J=AT/k integral-in
finity/0T(E)[F(E) - F(E - eV)]dE, where T(E) is the energy-dependent q
uantum tunneling probability and F(E) is the Fermi distribution functi
on. The contribution to the total current of both the thermionic emiss
ion and the tunneling are therefore included. The net doping concentra
tions under study range from 1.0 x 10(17) cm-3 to 1.0 x 10(19) cm-3. T
he reverse bias voltage across the barrier at a current density of 200
A/cm2 is used to assess whether the barrier is reduced to an ohmic co
ntact. A barrier of 0.3 eV is already an ohmic contact at doping conce
ntration p = 1.0 x 10(17) cm-3, while a barrier of 1.2 eV still behave
s like a diode even at p = 1.0 x 10(19) cm-3.