INTEGRATED PIN ELECTRONICS FOR AUTOMATIC TEST EQUIPMENT

Authors
GRACE JW DIPIETRO DM KISHIDA A KINSHO K
Citation
Jw. Grace et al., INTEGRATED PIN ELECTRONICS FOR AUTOMATIC TEST EQUIPMENT, HEWLETT-PAC, 45(5), 1994, pp. 42-50
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
HEWLETT-PACKARD JOURNAL
ISSN journal
00181153 → ACNP
Volume
45
Issue
5
Year of publication
1994
Pages
42 - 50
Database
ISI
SICI code
0018-1153(1994)45:5<42:IPEFAT>2.0.ZU;2-R