Authors
Citation
Ch. Diaz, AUTOMATION OF ELECTRICAL OVERSTRESS CHARACTERIZATION FOR SEMICONDUCTOR-DEVICES, HEWLETT-PAC, 45(5), 1994, pp. 106-111
Citations number
NO
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
HEWLETT-PACKARD JOURNAL
ISSN journal
00181153
→ ACNP
Volume
45
Issue
5
Year of publication
1994
Pages
106 - 111
Database
ISI
SICI code
0018-1153(1994)45:5<106:AOEOCF>2.0.ZU;2-B