P. Vandermeeren et al., RELEVANCE OF REFLECTION IN STATIC AND DYNAMIC LIGHT-SCATTERING EXPERIMENTS, Particle & particle systems characterization, 11(4), 1994, pp. 320-326
Citations number
15
Categorie Soggetti
Materials Science, Characterization & Testing","Engineering, Chemical
Using a monodisperse PMMA dispersion, it was shown that light reflecti
on at the sample cuvette walls may greatly influence the results of bo
th static (SLS) and dynamic (DLS) light scattering experiments. Consid
ering SLS, this reflection phenomenon mostly causes an overestimation
of the scattered intensity at high scattering angles, which may give r
ise to the emergence of an additional, artificial peak in the lower re
gion of the particle size distribution. On the other hand, the influen
ce of reflection on DLS measurements was shown to be particularly impo
rtant in the upper region of the particle size distribution. The exper
imentally observed phenomena were explained from the basic principles
of both particle sizing methods. Finally, it was shown that the distur
bing effect of reflection could be avoided by modifying either the har
dware or the software of the static and dynamic light scattering techn
ique.