SURFACE-DIFFUSION PROCESSES IN MOLECULAR-BEAM EPITAXIAL-GROWTH OF GAAS AND ALAS AS STUDIED ON GAAS (001)-(111)B FACET STRUCTURES

Citation
S. Koshiba et al., SURFACE-DIFFUSION PROCESSES IN MOLECULAR-BEAM EPITAXIAL-GROWTH OF GAAS AND ALAS AS STUDIED ON GAAS (001)-(111)B FACET STRUCTURES, Journal of applied physics, 76(7), 1994, pp. 4138-4144
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
7
Year of publication
1994
Pages
4138 - 4144
Database
ISI
SICI code
0021-8979(1994)76:7<4138:SPIMEO>2.0.ZU;2-2
Abstract
Mechanisms of molecular beam epitaxy have been investigated for GaAs a nd AlAs by growing and analyzing the shapes of facet structures consis ting of an (001) top surface and two (111)B side surfaces. It is found that all of the Ga flux on the three facet planes is incorporated int o the film, but the growth rates on (111)B and (001) depend strongly o n the As flux and are mainly determined by the diffusion of Ga ad-atom s between the two planes. In contrast, the diffusion of Al is found to be almost negligible, irrespective of the As flux. By analyzing the s hape of the facet, the diffusion length, lambda, of Ga on a (001) surf ace is estimated to be about 1 mum at 580-degrees-C, while that of Al is about 0.02 mum. On (111)B, lambda of Ga is found to be several mums . The reflectivity of diffusing Ga atoms is found to be far less than 1 for the (001)-(111)B boundary, and almost unity at facet boundaries where the (111)B side surfaces are bound by the (11BAR0) side walls.