BELOW GAP PHOTOREFLECTANCE OF SEMIINSULATING GAAS

Citation
H. Roppischer et al., BELOW GAP PHOTOREFLECTANCE OF SEMIINSULATING GAAS, Journal of applied physics, 76(7), 1994, pp. 4340-4343
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
76
Issue
7
Year of publication
1994
Pages
4340 - 4343
Database
ISI
SICI code
0021-8979(1994)76:7<4340:BGPOSG>2.0.ZU;2-9
Abstract
Below-gap structures in photoreflectance spectra of semi-insulating Ga As were observed originating from electroabsorption of light reflected from the back surface. The peak amplitude of these structures was str ongly temperature dependent within the range (78-290) K. The different lineshape at low temperature in comparison to that at room temperatur e suggested different physical mechanisms. This conclusion was proven experimentally using a two phase lock-in technique by which a fast (X) and slow (Y) component of the spectra could be separated. A fit proce dure provides the pure back surface reflection effect for both compone nts. The X mode dominating at low temperatures is attributed to electr omodulation of the field-broadened excitonic absorption tail whereas t he Y mode originates from the Franz-Keldysh electroabsorption.