CHARACTERIZATION OF CONCAVE-CURVED SPECTROMETERS FOR 2D X-RAY OPTICS

A procedure for calculating X-ray intensity profiles analytically for various X-ray diffraction geometries has been developed, which takes i nto account the misalignment, the solid angle factor, the effects of c onvergence and/or divergence of the diffracted X-rays. The approach is applicable to X-ray optics with either a point source or a quasi-para llel beam. Moreover, using this procedure allows one to calculate the magnified image from a plasma source, the intensity profiles of topogr aphs of bent crystals, and the spectral resolution of various focusing geometries. Several examples are presented to demonstrate the applica tions of this procedure. Using non-dispersive and dispersive double-cr ystal spectrometers, rocking curves were measured for singly and doubl y bent crystals. The agreement was satisfactory with the X-ray dynamic theory of bent crystals. Furthermore, we have also extended the study of X-ray optics to include the crystal anisotropic effects. The aniso tropic elasticity theory is applied to bend crystals for calculating t he diffracting region on the crystal surface. The anticlastic curvatur e effects are analytically demonstrated with respect to the crystals' diffracting area.