J. Bakmisiuk et al., COMPOSITION DETERMINATION OF SOME A(II)B(VI) TERNARY SEMICONDUCTORS FROM QUASI-FORBIDDEN REFLECTION INTENSITY, Acta Physica Polonica. A, 86(4), 1994, pp. 575-578
The aim of the present paper is to study the possibility of applicatio
n of the X-ray quasi-forbidden reflection method to the composition de
termination of the sphaleritc-type Cd1-xMxTe (M = Mg, Zn, Mn) single c
rystals. The method is based on the property of quasi-forbidden reflec
tions that their integral intensity is very sensitive to composition a
nd weakly sensitive to crystal lattice defects. An example of applicat
ion for a Cd1-xMnxTe single crystal is presented.