Electron probe microanalysis and X-ray diffraction studies have been p
erformed on samples of ternary Cd1-xMgxTe (0.05 less-than-or-equal-to
z less-than-or-equal-to 0.09) and quaternary Cd1-x-yMgxMuyTe (0.025 le
ss-than-or-equal-to x less-than-or-equal-to 0.4; 0.025 less-than-or-eq
ual-to y less-than-or-equal-to 0.7) alloys. The investigated samples w
ere cut froin 24 different ingots grown by Bridgman method. Microprobe
examinations have revealed significant differences between actual and
nominal content of Mg along the longitudinal direction for both terna
ry and quaternary ingots. In contrast to Mg, for most Cd1-x-yMgxMnyTe
samples the actual Mn content was within +/-5% of nominal content. The
lattice constants have been determined by X-ray powder diffraction me
thod. Whereas Cd1-x-yMgxMnyTe samples exhibit only zinc blende crystal
structure for the entire region of x and y investigated, the Cd1-xMgx
Te alloy has two different structures depending on Mg content; a zinc
blende structure below x = 0.5 and a wurtzite structure above it. In b
oth alloys the lattice constant decreases with increasing Mg content.