INTERPRETATION OF DIFFERENTIAL ANOMALOUS X-RAY-SCATTERING DATA FOR AMORPHOUS CD-AS

The computational procedure, based on Warren's exact method for an amo rphous sample with more than one atom, was developed to obtain the sho rt-range order structural parameters from the differential anomalous X -ray scattering data, collected using the synchrotron radiation. The e xperimental differential radial distribution functions were fitted wit h the true distribution functions expressed in an analytical form and broadened by convolution with the pair functions. It was found that at oms in the amorphous Cd-As films remain almost tetrahedrally coordinat ed and the investigated alloys are chemically ordered.