ANALYSIS OF THE METAL-SEMICONDUCTOR STRUCTURAL PHASE-TRANSITION IN FESI2 BY TIGHT-BINDING MOLECULAR-DYNAMICS

Citation
L. Miglio et al., ANALYSIS OF THE METAL-SEMICONDUCTOR STRUCTURAL PHASE-TRANSITION IN FESI2 BY TIGHT-BINDING MOLECULAR-DYNAMICS, Europhysics letters, 37(6), 1997, pp. 415-420
Citations number
17
Categorie Soggetti
Physics
Journal title
ISSN journal
02955075
Volume
37
Issue
6
Year of publication
1997
Pages
415 - 420
Database
ISI
SICI code
0295-5075(1997)37:6<415:AOTMSP>2.0.ZU;2-T
Abstract
We show that tight-binding molecular dynamics provides a detailed desc ription of the relations between structural deformations and changes i n the electronic features during a Jahn-Teller process. In this case t he metal-semiconductor displacitive phase transition occurring in epit axial FeSi2 with film thickness can be correctly reproduced and interp reted by variable cell molecular dynamics for the bulk configuration. We show that it actually corresponds to a pattern of local Jahn-Teller distortions occurring at selected sites in different times, so that t he configurational evolution cannot be described by a global coordinat e.