We have succeeded in obtaining excellent Back Surface Field (BSF) stru
ctures by depositing a highly doped silicon layer on the back side of
the substrate even though the textured wafer is used. The substantial
increase of the spectral response in longer wavelength has been observ
ed and an increase of V-oc has also been found. The BSF formation tech
nology, together with the low temperature grown thin a-Si emitter laye
r with appropriate bandgap, has enabled us to obtain a very high J(sc)
of 40.5 mA/cm(2), thus a high active area conversion efficiency of 18
.9% (V-oc = 0.592 V, FF = 0.789).