ACCELERATED DEGRADATION TEST METHOD FOR A-SI PV MODULES

The first-year degradation rate of P-max (degradation in 1 year) and t he seasonal behaviour of amorphous silicon photovoltaic modules are ve ry important for the design of PV systems using them and for R&D of a- Si PV modules with small degradation and high stabilized efficiency. I t is profitable to estimate them in a short time. We obtained accurate degradation data from periodical measurements using a solar simulator at standard test condition (STC) and we have analyzed outdoor exposur e test data at Setagaya site in Tokyo. Paying attention to two main st resses of light intensity and sample temperature for electrical parame ters of a-Si PV modules, we tried to establish a constant-stress accel erated degradation test method for a-Si PV modules by using a light-te mperature combined accelerated test chamber and studied an applicabili ty of light soaking.