THICKNESS DEPENDENCE OF THE NEEL TEMPERATURE AND TCR OF MNSE FILMS

Authors
THANIGAIMANI V ANGADI MA
Citation
V. Thanigaimani et Ma. Angadi, THICKNESS DEPENDENCE OF THE NEEL TEMPERATURE AND TCR OF MNSE FILMS, Physica status solidi. a, Applied research, 145(1), 1994, pp. 105-111
Citations number
25
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
145
Issue
1
Year of publication
1994
Pages
105 - 111
Database
ISI
SICI code
0031-8965(1994)145:1<105:TDOTNT>2.0.ZU;2-E
Abstract
The temperature dependence of sheet resistance, the size effect of the temperature coefficient of resistance (TCR), and the Neel temperature for films in the thickness range 25 to 180 nm are reported. A compute r based technique is used within the framework of the Mayadas-Shatzkes (MS) model to calculate the parameters p, R, l, and beta(0), The expe rimental data are in good agreement with the MS model over thel temper ature and TCR are dependent on the substrate temperature, composition, and film thickness.