STUDY OF THE NICKEL-ALUMINA INTERFACE BY XPS AND XAES

Authors
EALET B GILLET E NEHASIL V MOLLER PJ
Citation
B. Ealet et al., STUDY OF THE NICKEL-ALUMINA INTERFACE BY XPS AND XAES, Surface science, 318(1-2), 1994, pp. 151-157
Citations number
43
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
318
Issue
1-2
Year of publication
1994
Pages
151 - 157
Database
ISI
SICI code
0039-6028(1994)318:1-2<151:SOTNIB>2.0.ZU;2-R
Abstract
The first steps of the formation of the nickel-alumina interface were characterized by Auger electron spectroscopy, X-ray photoelectron spec troscopy and by Auger parameter (alpha') analysis. gamma-alumina thin films were used as support to avoid static charge problems which occur on bulk surfaces. The electronic structure of the interface yields ev idence for the formation of oxide phases which give an ionic character to the nickel-alumina bonding.