THE ELECTRONIC-STRUCTURE OF INGAAS INP QUANTUM-WELLS MEASURED BY FOURIER-TRANSFORM PHOTOLUMINESCENCE EXCITATION SPECTROSCOPY/

Citation
J. Dalfors et al., THE ELECTRONIC-STRUCTURE OF INGAAS INP QUANTUM-WELLS MEASURED BY FOURIER-TRANSFORM PHOTOLUMINESCENCE EXCITATION SPECTROSCOPY/, Journal of applied physics, 80(12), 1996, pp. 6855-6860
Citations number
22
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
80
Issue
12
Year of publication
1996
Pages
6855 - 6860
Database
ISI
SICI code
0021-8979(1996)80:12<6855:TEOIIQ>2.0.ZU;2-P
Abstract
We report on novel results from a systematic study of excitonic transi tions in high quality metalorganic vapor phase epitaxy grown InxGa1-xA s/InP quantum wells (QWs). The electronic structure of the QWs has bee n studied as a function of QW width as well as the built-in strain. Th e characterization has been performed by means of a combined Fourier t ransform photoluminescence (FTPL) and FTPL excitation study of the Inx Ga1-xAs/InP QWs. Detailed information on the energy positions for the excitons associated with various subbands (for the electrons, heavy an d light holes) up to n = 5 have been obtained. The experimentally dete rmined energy positions have been compared with theoretical prediction s based on an effective mass model and bulk deformation potential theo ry. (C) 1996 American Institute of Physics.