J. Dalfors et al., THE ELECTRONIC-STRUCTURE OF INGAAS INP QUANTUM-WELLS MEASURED BY FOURIER-TRANSFORM PHOTOLUMINESCENCE EXCITATION SPECTROSCOPY/, Journal of applied physics, 80(12), 1996, pp. 6855-6860
We report on novel results from a systematic study of excitonic transi
tions in high quality metalorganic vapor phase epitaxy grown InxGa1-xA
s/InP quantum wells (QWs). The electronic structure of the QWs has bee
n studied as a function of QW width as well as the built-in strain. Th
e characterization has been performed by means of a combined Fourier t
ransform photoluminescence (FTPL) and FTPL excitation study of the Inx
Ga1-xAs/InP QWs. Detailed information on the energy positions for the
excitons associated with various subbands (for the electrons, heavy an
d light holes) up to n = 5 have been obtained. The experimentally dete
rmined energy positions have been compared with theoretical prediction
s based on an effective mass model and bulk deformation potential theo
ry. (C) 1996 American Institute of Physics.