Zc. Li et al., SABATPG - A STRUCTURAL-ANALYSIS BASED AUTOMATIC TEST-GENERATION SYSTEM, Science in China. Series A, Mathematics, Physics, Astronomy & Technological Sciences, 37(9), 1994, pp. 1104-1114
A TPG system, SABATPG, is given based on a generic structural model of
large circuits. Three techniques of partial implication, aftereffect
of identified undetectable faults and shared sensitization with new co
ncepts of localization and aftereffect are employed in the system to i
mprove FAN algorithm Experiments for the 10 ISCAS benchmark circuits s
how that the computing time of SABATPG for test generation is 19.42% l
ess than that of FAN algorithm.