DELAYED ELECTRON-EMISSION FROM ELECTRONICALLY SPUTTERED C60- IONS

Rates of electron detachment form secondary C60- ions sputtered by swi ft atomic projectiles (19.7-MeV S, 48.6-MeV Br, and 78.2-MeV I) from C 60 films are determined and employed to estimate the internal excitati on energy of the sputtered C60- ions. While the C60- -ion yields vary as the third power of the incident ion energy loss in the solid, no de pendence has been found in the internal energy content of sputtered C6 0- ions on ion parameters. These results illustrate the use of C60 ful lerenes as a ''molecular thermometer,'' and contribute to the elucidat ion of the ion-sputtering process.