A LOWER TEMPERATURE LIMIT FOR THE RIED EFFECT

Authors
MORONO A HODGSON ER
Citation
A. Morono et Er. Hodgson, A LOWER TEMPERATURE LIMIT FOR THE RIED EFFECT, Journal of nuclear materials, 215, 1994, pp. 1119-1122
Citations number
19
Categorie Soggetti
Nuclear Sciences & Tecnology","Metallurgy & Mining","Material Science
Journal title
Journal of nuclear materials → ACNP
ISSN journal
00223115
Volume
215
Year of publication
1994
Part
B
Pages
1119 - 1122
Database
ISI
SICI code
0022-3115(1994)215:<1119:ALTLFT>2.0.ZU;2-W
Abstract
Measurements have been made on the influence of an electric field on t he F+-centre production in aluminium oxide during 2 MeV electron irrad iation, as a means of determining the lowest temperature at which RIED (radiation-induced electrical degradation) may occur. A lower tempera ture limit of 150 degrees C has been established.