SCANNING TUNNELING MICROSCOPIC ROUGHNESS STATISTICS ON THE ELECTROCHEMICAL QUARTZ MICROBALANCE

Authors
Citation
W. Kautek et M. Sahre, SCANNING TUNNELING MICROSCOPIC ROUGHNESS STATISTICS ON THE ELECTROCHEMICAL QUARTZ MICROBALANCE, Surface & coatings technology, 67(3), 1994, pp. 167-171
Citations number
13
Categorie Soggetti
Materials Science, Coatings & Films
ISSN journal
02578972
Volume
67
Issue
3
Year of publication
1994
Pages
167 - 171
Database
ISI
SICI code
0257-8972(1994)67:3<167:STMRSO>2.0.ZU;2-0
Abstract
Morphological changes and reconstructions of metallic electrode surfac es can prevent direct monitoring of the molecular organization in the electrochemical double layer by means of the electrochemical quartz mi crobalance (EQMB). Roughness can feign mass changes by carrying electr olyte in surface pockets. There are contradictory results from EQMB, c harge, and scanning electron microscopy morphology investigations. We resolved these problems by a statistical evaluation of scanning tunnel ing microscopic images at gold surfaces emersed at relevant potentials . No roughness change was observed in the hydroxide monolayer potentia l region because this is thermodynamically more favourable, especially in base, than growth of a three-dimensional hydroxide layer involving molecular place exchange connected with roughening.