Sj. Stranick et al., A LOW-TEMPERATURE, ULTRAHIGH-VACUUM, MICROWAVE-FREQUENCY-COMPATIBLE SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 65(10), 1994, pp. 3211-3215
To expand the capabilities of the microwave frequency alternating curr
ent scanning tunneling microscope to include the ability to study isol
ated adsorbates and highly reactive surfaces, we have developed a low
temperature, ultrahigh vacuum alternating current scanning tunneling m
icroscope. In this alternating current scanning tunneling microscope,
we employ the reliable beetle-style sample approach mechanism with a n
umber of other components unique to a low temperature scanning tunneli
ng microscope. These include the sample transfer, delivery, retrieval,
storage, sputtering, and heating systems. This alternating current sc
anning tunneling microscope operates at 77 and 4 K.