A LOW-TEMPERATURE, ULTRAHIGH-VACUUM, MICROWAVE-FREQUENCY-COMPATIBLE SCANNING TUNNELING MICROSCOPE

Citation
Sj. Stranick et al., A LOW-TEMPERATURE, ULTRAHIGH-VACUUM, MICROWAVE-FREQUENCY-COMPATIBLE SCANNING TUNNELING MICROSCOPE, Review of scientific instruments, 65(10), 1994, pp. 3211-3215
Citations number
8
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
65
Issue
10
Year of publication
1994
Pages
3211 - 3215
Database
ISI
SICI code
0034-6748(1994)65:10<3211:ALUMS>2.0.ZU;2-1
Abstract
To expand the capabilities of the microwave frequency alternating curr ent scanning tunneling microscope to include the ability to study isol ated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current scanning tunneling m icroscope. In this alternating current scanning tunneling microscope, we employ the reliable beetle-style sample approach mechanism with a n umber of other components unique to a low temperature scanning tunneli ng microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current sc anning tunneling microscope operates at 77 and 4 K.