DEPENDENCE ON THE IN CONCENTRATION OF THE PIEZOELECTRIC FIELD IN (111)B INGAAS GAAS STRAINED HETEROSTRUCTURES/

Citation
Jl. Sanchezrojas et al., DEPENDENCE ON THE IN CONCENTRATION OF THE PIEZOELECTRIC FIELD IN (111)B INGAAS GAAS STRAINED HETEROSTRUCTURES/, Applied physics letters, 65(16), 1994, pp. 2042-2044
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
16
Year of publication
1994
Pages
2042 - 2044
Database
ISI
SICI code
0003-6951(1994)65:16<2042:DOTICO>2.0.ZU;2-I
Abstract
A series of (111)B InxGa1-x(As/GaAs multiple quantum well p-i-n struct ures have been investigated via low temperature photocurrent and photo luminescence spectroscopies. The indium mole fraction was in the range of 0.07-0.23. Evolution of the experimental blueshifts of the transit ion energies, with the external bias, agreed very well with the theore tical calculations. This allowed us to obtain precise information abou t the piezoelectric constant, e14, for the various In compositions. Fo r the range of x investigated, we have found e14(x) to be linear with x but significantly lower than predicted by a simple linear interpolat ion of the accepted values for GaAs and InAs. (C) 1994 American Instit ute of Physics.