Low energy ion-scattering and ion-recoil (LEIS and LEIR) spectroscopie
s have been used to monitor the structure and composition of an InSb (
100) surface during continuous irradiation with argon ions (4.8 keV) d
irected at grazing incidence. Oscillations in both the scattered and r
ecoil ion intensities have been observed during all bombardment sequen
ces (for doses > 2 x 10(16) ions/cm2). The periods of these oscillatio
ns show some dependence on the experimental geometry, and are close to
those predicted for sputter-removal of one or two surface layers. Int
erestingly, the surface shows no sign of becoming amorphous even follo
wing excess ion bombardment. Details of the variations in surface comp
osition are assigned, not only to layer-by-layer depth profiling, but
also by rapid diffusion of Sb to the surface from the Sb depleted latt
ice. These data indicate that LEIS and LEIR can be used to monitor com
position profiles with monolayer depth resolution such that different
states of the same surface can be achieved simply and controllably by
terminating ion bombardment following a pre-determined irradiation dos
e.