CHARACTERIZATION OF THIN ELECTROLESS NICKEL COATINGS

Authors
Citation
Nm. Martyak, CHARACTERIZATION OF THIN ELECTROLESS NICKEL COATINGS, Chemistry of materials, 6(10), 1994, pp. 1667-1674
Citations number
31
Categorie Soggetti
Chemistry Physical","Material Science
Journal title
ISSN journal
08974756
Volume
6
Issue
10
Year of publication
1994
Pages
1667 - 1674
Database
ISI
SICI code
0897-4756(1994)6:10<1667:COTENC>2.0.ZU;2-A
Abstract
The early stages of electroless nickel growth on copper {100} were cha racterized using scanning tunneling and transmission electron microsco py. A long induction time was observed prior to nickel deposition. Sca nning tunneling microscopy analysis showed all deposits grew by the la teral spreading of atomic layers followed by the formation and coalesc ence of three-dimensional structures. Transmission electron microscopy studies showed low-phosphorus electroless nickel coatings consisted o f discrete islands which coalesced into continuous films. Low-phosphor us deposits were crystalline. Medium-phosphorus deposits were more con tinuous than low phosphorus coatings and exhibited a semiamorphous str ucture. High-phosphorus deposits were continuous and amorphous. This s ize of coherently diffracting crystallites decreased with an increase in the phosphorus content of the nickel films. Three dimensional surfa ce structures observed with STM agrees with the size of the crystallit es from TEM analysis.