A straightforward, in situ calibration procedure for a vacuum ultravio
let (vuv) double-reflection polarization analyser is introduced which
does not require knowledge of the optical properties of the reflecting
materials or previously measured benchmark polarizations. The linear
and circular polarization sensitivities of the analyser are determined
from vuv light intensity measurements obtained for various mutual ori
entations of the two reflecting surfaces. As an example of the reliabi
lity of the calibration procedure, measurements of integrated Stokes p
arameters are presented and compared with the results of measurements
carried out previously by other groups using different polarization an
alysers.