S. Tsukamoto et N. Koguchi, OBSERVATION OF SULFUR-TERMINATED GAAS(001)-(2X6) RECONSTRUCTION BY SCANNING-TUNNELING-MICROSCOPY, Applied physics letters, 65(17), 1994, pp. 2199-2201
Scanning tunneling microscopy (STM) images of smooth, in situ prepared
, sulfur-terminated (S-terminated) GaAs(001) surface reconstruction ar
e presented. It is found that (2X6) surface reconstruction is dominant
on the S-terminated GaAs(001) surface. This (2X6) reconstruction, of
which the cell contains five S-S adatom dimers, is determined by both
STM and reflection high-energy electron diffraction. The atomic model,
which is consistent with both STM images and electron counting heuris
tics, is also shown. Moreover, this (2X6) reconstruction is also obser
ved in the case of an (NH4)(2)S-x-treated surface. (C) 1994 American I
nstitute of Physics.