OBSERVATION OF SULFUR-TERMINATED GAAS(001)-(2X6) RECONSTRUCTION BY SCANNING-TUNNELING-MICROSCOPY

Citation
S. Tsukamoto et N. Koguchi, OBSERVATION OF SULFUR-TERMINATED GAAS(001)-(2X6) RECONSTRUCTION BY SCANNING-TUNNELING-MICROSCOPY, Applied physics letters, 65(17), 1994, pp. 2199-2201
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
65
Issue
17
Year of publication
1994
Pages
2199 - 2201
Database
ISI
SICI code
0003-6951(1994)65:17<2199:OOSGRB>2.0.ZU;2-C
Abstract
Scanning tunneling microscopy (STM) images of smooth, in situ prepared , sulfur-terminated (S-terminated) GaAs(001) surface reconstruction ar e presented. It is found that (2X6) surface reconstruction is dominant on the S-terminated GaAs(001) surface. This (2X6) reconstruction, of which the cell contains five S-S adatom dimers, is determined by both STM and reflection high-energy electron diffraction. The atomic model, which is consistent with both STM images and electron counting heuris tics, is also shown. Moreover, this (2X6) reconstruction is also obser ved in the case of an (NH4)(2)S-x-treated surface. (C) 1994 American I nstitute of Physics.