SURFACE CHARACTERIZATION OF CERAMIC MEMBRANES BY ATOMIC-FORCE MICROSCOPY

Authors
BOTTINO A CAPANNELLI G GROSSO A MONTICELLI O CAVALLERI O ROLANDI R SORIA R
Citation
A. Bottino et al., SURFACE CHARACTERIZATION OF CERAMIC MEMBRANES BY ATOMIC-FORCE MICROSCOPY, Journal of membrane science, 95(3), 1994, pp. 289-296
Citations number
20
Categorie Soggetti
Engineering, Chemical","Polymer Sciences
Journal title
Journal of membrane science → ACNP
ISSN journal
03767388
Volume
95
Issue
3
Year of publication
1994
Pages
289 - 296
Database
ISI
SICI code
0376-7388(1994)95:3<289:SCOCMB>2.0.ZU;2-A
Abstract
Atomic force microscopy (AFM) has been used to investigate the surface of ultrafiltration and microfiltration ceramic membranes. The AFM has been shown to resolve the feature of the gamma-Al2O3 selective skin l ayer of ultrafiltration membranes providing information on both the si ze and shape of the gamma-Al2O3 particles as well as the surface rough ness of the skin. When applied to study alpha-Al2O3 microfiltration me mbranes the AFM has been shown to yield results very similar to those obtained by conventional scanning electron microscopy.