ULTRAHIGH FINESSE MICROCAVITY WITH DISTRIBUTED BRAGG REFLECTORS

Authors
STANLEY RP HOUDRE R OESTERLE U GAILHANOU M ILEGEMS M
Citation
Rp. Stanley et al., ULTRAHIGH FINESSE MICROCAVITY WITH DISTRIBUTED BRAGG REFLECTORS, Applied physics letters, 65(15), 1994, pp. 1883-1885
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
65
Issue
15
Year of publication
1994
Pages
1883 - 1885
Database
ISI
SICI code
0003-6951(1994)65:15<1883:UFMWDB>2.0.ZU;2-G
Abstract
We have grown a very high finesse microcavity using distributed Bragg reflectors of AlxGa1-xAs and AlAs. The measured Fabry-Perot mode has a linewidth of 0.84 angstrom at 930 nm. This implies a finesse in exces s of 5500 and an effective (mirror corrected) finesse greater than 145 0. Comparison with theoretical calculations for such a structure shows that (i) the growth rates are stable to 0.25% over 14 h and (ii) the internal losses are less than 1 cm-1. (C) 1994 American Institute of P hysics.