In this work we apply a force modulation technique to a standard atomi
c force microscope (AFM) in order to study the elasticity of individua
l polystyrene molecules. The sample mounted on a piezoelectric tube wa
s forced to vibrate along the z direction. The corresponding modulatio
n of the cantilever, which reflects the spring constant of the sample,
was phase sensitively detected and measured as a function of the surf
ace topography. The image contrast in these images is based on local v
ariations of the surface elasticity. Compared to the conventional AFM
topography image, the elasticity image shows an enhanced contrast with
pronounced molecular structure. (C) 1994 American Institute of Physic
s.