CdTe layers were grown by metalorganic vapor phase epitaxy (MOVPE) on
different substrates like sapphire, GaAs, and CdTe wafers. The growth
was carried out at the temperature 340 degrees C and time in the range
of 2-4 h using dimethyl-cadmium and diisopropil-tellurium as precurso
rs. The layers were studied by scanning electron microscopy, Rutherfor
d backscattering spectroscopy, and high resolution low-temperature pho
toluminescence spectroscopy. The surface morphology and RES and PL spe
ctra of CdTe MOVPE layers are reported and the substrate effect on the
layer properties is demonstrated. (C) 1997 American Institute of Phys
ics.