Jp. Banerjee et R. Mukherjee, CALCULATION OF SHIFT OF AVALANCHE TRANSIT-TIME PHASE DELAY DUE TO OPTICALLY INJECTED CARRIERS IN INDIUM-PHOSPHIDE AVALANCHE-DIODES, Electronics Letters, 30(20), 1994, pp. 1716-1717
A computer method for the calculation of the phase shift due to optica
lly injected carriers in an InP avalanche transit time diode has been
suggested using the numerically simulated negative resistance profiles
in the depletion layer of the diode. The results show that the phase
shift due to hole injection is larger than that due to electron inject
ion which explains the pronounced effect of photogenerated hole leakag
e current in modulating the microwave properties of InP diodes.