C. Venzago et M. Weigert, APPLICATION OF THE GLOW-DISCHARGE MASS-SPECTROMETRY (GDMS) FOR THE MULTIELEMENT TRACE AND ULTRATRACE ANALYSIS OF SPUTTERING TARGETS, Fresenius' journal of analytical chemistry, 350(4-5), 1994, pp. 303-309
Glow discharge mass spectrometry using a VG9000 high resolution mass s
pectrometer has been applied to both the multi-element trace and ultra
trace analyses of sputtering target materials, i.e. aluminium-based a
lloys, cobalt-based alloys, titanium and platinum. Element dependent r
elative sensitivity factors (RSF) have been determined using reference
materials in order to provide the possibility for quantitative analys
es. Aluminium-based and cobalt-based alloys have been extensively anal
ysed to demonstrate precision of GDMS analyses. Detection limits in th
e ng/g and sub-ng/g ranges, i.e. 0.2 ng/g for U and Th have been deter
mined in aluminium-based alloys. Comparative analyses for alloy compon
ents in cobalt-based alloys as well as trace concentrations in titaniu
m have been performed. GDMS has been also applied to multi-element dep
th profile analyses in contaminated and noncontaminated platinum targe
ts.